| [29] | T. Saraya, K. Itou, T. Takakura, M. Fukui, S. Suzuki, K. Takeuchi, M. Tsukuda, K. Satoh, T. Matsudai, K. Kakushima, T. Hoshii, K. Tsutsui, H. Iwai, A. Ogura, W. Saito, S. Nishizawa, I. Omura, H. Ohashi, and T. Hiramoto, “3.3 kV Back-Gate-Controlled IGBT (BC-IGBT) Using Manufacturable Double-Side Process Technology”, International Electron Devices Meeting (IEDM), Virtual Conference, pp. 87 - 90, December 12, 2020.
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| [28] | Chengji Jin, Kyungmin Jang, Takuya Saraya, Toshiro Hiramoto, and Masaharu Kobayashi, “Experimental Study on the Role of Polarization Switching in Subthreshold Characteristics of HfO2-based Ferroelectric and Anti-ferroelectric FET”, International Electron Devices Meeting (IEDM), Hilton San Francisco Union Square, San Francisco, CA, USA, pp. 723 - 726, December 5, 2018.
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| [27] | Fei Mo, Yusaku Tagawa, Takuya Saraya, Toshiro Hiramoto, and Masaharu Kobayashi, “Scalability Study on Ferroelectric-HfO2 Tunnel Junction Memory Based on Non-equilibrium Green Function Method with Self-consistent Potential”, International Electron Devices Meeting (IEDM), Hilton San Francisco Union Square, San Francisco, CA, USA, pp. 372 - 375, December 4, 2018.
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| [26] | T. Saraya, K. Itou, T. Takakura, M. Fukui, S. Suzuki, K. Takeuchi, M. Tsukuda, Y. Numasawa, K. Satoh, T. Matsudai, W. Saito, K. Kakushima, T. Hoshii, K. Furukawa, M. Watanabe, N. Shigyo, K. Tsutsui, H. Iwai, A. Ogura, S. Nishizawa, I. Omura, H. Ohashi, and T. Hiramoto, “Demonstration of 1200V Scaled IGBTs Driven by 5V Gate Voltage with Superiorly Low Switching Loss”, International Electron Devices Meeting (IEDM), Hilton San Francisco Union Square, San Francisco, CA, USA, pp. 189 - 192, December 3, 2018.
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| [25] | Masaharu Kobayashi, Nozomu Ueyama, Kyungmin Jang, and Toshiro Hiramoto, “Experimental Study on Polarization-Limited Operation Speed of Negative Capacitance FET with Ferroelectric HfO2”, IEEE International Electron Devices Meeting (IEDM), Hilton San Francisco Union Square, San Francisco, CA, USA, pp. 314 - 317, December 6, 2016.
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| [24] | K. Kakushima, T. Hoshii, K. Tsutsui, A. Nakajima, S. Nishizawa, H. Wakabayashi, I. Muneta, K. Sato, T. Matsudai, W. Saito, T. Saraya, K. Itou, M. Fukui, S. Suzuki, M. Kobayashi, T. Takakura, T. Hiramoto, A. Ogura, Y. Numasawa, I. Omura, H. Ohashi, and H. Iwai, IEEE International Electron Devices Meeting (IEDM), Hilton San Francisco Union Square, San Francisco, CA, USA, pp. 268 - 271, December 6, 2016.
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| [23] | M. Goto, K. Hagiwara, Y. Iguchi, H. Ohtake, T. Saraya, M. Kobayashi, E. Higurashi, H. Toshiyoshi, and T. Hiramoto, "Three-Dimensional Integrated CMOS Image Sensors with Pixel-Parallel A/D Converters Fabricated by Direct Bonding of SOI Layers", San Francisco, CA, USA, December 15, 2014.
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| [22] | Tomoko Mizutani, Anil Kumar, and Toshiro Hiramoto, "Analysis of Transistor Characteristics in Distribution Tails beyond ±5.4σ of 11 Billion Transistors", IEEE International Electron Devices Meeting (IEDM), Washington, D.C., USA, pp. 826 - 829, December 11, 2013.
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| [21] | H. Makiyama, Y. Yamamoto, H. Shinohara, T. Iwamatsu, H. Oda, N. Sugii, K. Ishibashi, T. Mizutani, T. Hiramoto, and Y. Yamaguchi, "Suppression of Die-to-Die Delay Variability of Silicon on Thin Buried Oxide (SOTB) CMOS Circuits by Balanced P/N Drivability Control with Back-Bias for Ultralow-Voltage (0.4 V) Operation", IEEE International Electron Devices Meeting (IEDM), Washington, D.C., USA, pp. 822 - 825, December 11, 2013.
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| [20] | Tomoko Mizutani, Anil Kumar, and Toshiro Hiramoto, "Measuring Threshold Voltage Variability of 10G Transistors", International Electron Devices Meeting (IEDM), Washington, D.C., USA, pp. 563 E566, December 7, 2011.
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| [19] | X. Song, M. Suzuki, T. Saraya, A. Nishida, T. Tsunomura, S. Kamohara, K. Takeuchi, S. Inaba, T. Mogami, and T. Hiramoto, "Impact of DIBL Variability on SRAM Static Noise Margin Analyzed by DMA SRAM TEG", International Electron Devices Meeting (IEDM), San Francisco, CA, USA, pp. 62 - 65, December 6, 2010.
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| [18] | Ken Shimizu, Takuya Saraya, and Toshiro Hiramoto, "Physical Understandings of Si (110) Hole Mobility in Ultra-Thin Body pFETs by <110> and <111> Uniaxial Compressive Strain", International Electron Devices Meeting (IEDM), Baltimore, MD, USA, pp. 473 - 476, December 8, 2009.
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| [17] | YeonJoo Jeong, Jiezhi Chen, Takuya Saraya, and Toshiro Hiramoto, "Uniaxial Strain Effects on Silicon Nanowire pMOSFET and Single-Hole Transistor at Room Temperature", IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, pp. 761 - 764, December 17, 2008.
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| [16] | Jiezhi Chen, Takuya Saraya, and Toshiro Hiramoto, "Electron Mobility in Multiple Silicon Nanowires GAA nMOSFETs on (110) and (100) SOI at Room and Low Temperature", IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, pp. 757 - 760, December 17, 2008.
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| [15] | Ken Shimizu, Takuya Saraya and Toshiro Hiramoto, "Experimental Investigation on the Origin of Direction Dependence of Si (110) Hole Mobility Utilizing Ultra-Thin Body pMOSFETs", IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, pp. 67 - 70, December 15, 2008.
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| [14] | Ken Shimizu and Toshiro Hiramoto, "Mobility Enhancement in Uniaxially Strained (110) oriented Ultra-Thin Body Single- and Double-Gate MOSFETs with SOI Thickness of less than 4 nm", International Electron Devices Meeting (IEDM), Washington Hilton, Washington D. C., USA, pp. 715 - 718, December 12, 2007.
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| [13] | K. Takeuchi, T. Fukai, T. Tsunomura, A. T. Putra, A. Nishida, S. Kamohara, and T. Hiramoto, "Understanding Random Threshold Voltage Fluctuation by Comparing Multiple Fabs and Technologies", International Electron Devices Meeting (IEDM), Washington Hilton, Washington D. C., USA, pp. 467 - 470, December 11, 2007.
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| [12] | Masaharu Kobayashi and Toshiro Hiramoto, "Experimental Study on Quantum Structure of Silicon Nano Wire and Its Impact on Nano Wire MOSFET and Single-Electron Transistor", IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, pp. 1007 - 1009, December, 2006.
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| [11] | Tetsu Ohtou, Takuya Saraya, Kimiaki Shimokawa, Yasuhiro Doumae, Yoshiki Nagatomo, Jiro Ida and Toshiro Hiramoto, "Experimental Demonstrations of Superior Characteristics of Variable Body-Factor (ƒÁ) Fully-Depleted SOI MOSFETs with Extremely Thin BOX of 10nm", IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, pp. pp. 877 - 880 December, 2006.
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| [10] | Gen Tsutsui, Masumi Saitoh, Takuya Saraya, Toshiharu Nagumo, and Toshiro Hiramoto, "Mobility Enhancement due to Volume Inversion in (110)-oriented Ultra-thin Body Double-gate nMOSFETs with Body Thickness less than 5 nm", International Electron Devices Meeting (IEDM), Washington D.C., USA, pp. 747 - 750, December, 2005.
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| [9] | Masumi Saitoh, Hidehiro Harata, and Toshiro Hiramoto, "Room-Temperature Demonstration of Integrated Silicon Single-Electron Transistor Circuits for Current Switching and Analog Pattern Matching", IEEE Electron Devices Meeting (IEDM), San Francisco, USA, pp. 187 - 190, December, 2004. This paper received the 2004 Roger A. Haken Best Student Paper Award.
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| [8] | Il-Gweon Kim, Kosuke Yanagidaira, and Toshiro Hiramoto, "Integration of Fluorinated Nano-Crystal Memory Cells with 4.6F2 Size by Landing Plug Polysilicon Contact and Direct-Tungsten Bitline", 2003 International Electron Devices Meeting (IEDM), Washington DC, USA, pp. 605 - 608, December, 2003.
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| [7] | Masumi Saitoh and Toshiro Hiramoto, "Room-Temperature Operation of Highly Functional Single-Electron Transistor Logic Based on Quantum Mechanical Effect in Ultra-Small Silicon Dot", 2003 International Electron Devices Meeting (IEDM), Washington DC, USA, pp. 753 - 756, December, 2003. |
| [6] | M. Saitoh, E. Nagata, and T. Hiramoto, "Effects of ultra-narrow channel on characteristics of MOSFET memory with silicon nanocrystal floating gates", 2002 IEEE International Electron Devices Meeting (IEDM), San Francisco, USA, pp. 181 - 184, December, 2002. |
| [5] | H. Majima, Y. Saito, and T. Hiramoto, "Impact of Quantum Mechanical Effects on Design of Nano-scale Narrow Channel n- and p-type MOSFETs", 2001 IEEE International Electron Devices Meeting (IEDM), Washington D.C., USA, pp. 733 - 736, December, 2001. This paper received the 2001 Roger A. Haken Best Student Paper Award. |
| [4] | H. Majima, H. Ishikuro, and T. Hiramoto, "Threshold Voltage Increase by Quantum Mechanical Narrow Channel Effect in Ultra-Narrow MOSFETs", 1999 IEEE International Electron Devices Meeting (IEDM), Washington D.C., USA, pp. 379 - 382, December, 1999. |
| [3] | N. Takahashi, H. Ishikuro, and T. Hiramoto, "A Directional Current Switch Using Silicon Single Electron Transistors Controlled by Charge Injection into Silicon Nano-Crystal Floating Dots", 1999 IEEE International Electron Devices Meeting (IEDM), Washington D.C., USA, pp. 371 - 374, December, 1999. |
| [2] | Makoto Takamiya and Toshiro Hiramoto, "High Performance Electrically Induced Body Dynamic Threshold SOI MOSFET (EIB-DTMOS) with Large Body Effect and Low Threshold Voltage", 1998 IEEE International Electron Devices Meeting, pp. 423 - 426, San Francisco, USA, December, 1998. |
| [1] | Hiroki Ishikuro and Toshiro Hiramoto, "Influence of Quantum Confinement Effects on Single Electron and Single Hole Transistors", 1998 IEEE International Electron Devices Meeting, pp. 119 - 123, San Francisco, USA, December, 1998. |
| [27] | F. Mo, J. Xiang, X. Mei, Y. Sawabe, T. Saraya, T. Hiramoto, C.-J. Su, V. P-H. Hu, and M. Kobayashi, “Critical Role of GIDL Current for Erase Operation in 3D Vertical FeFET and Compact Long-Term FeFET Retention Model”, Symposium on VLSI Technology, T16-2, June 19, 2021.
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| [26] | J. Wu, F. Mo, T. Saraya, T. Hiramoto, M. Ochi, H. Goto, and M. Kobayashi, “Mobility-Enhanced FET and Wakeup-Free Ferroelectric Capacitor Enabled by Sn-doped InGaZnO for 3D Embedded RAM Application”, Symposium on VLSI Technology, Online Conference, T6-2, June 17, 2021.
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| [25] | Jixuan Wu, Fei Mo, Takuya Saraya, Toshiro Hiramoto, and Masaharu Kobayashi, “A Monolithic 3D Integration of RRAM Array with Oxide Semiconductor FET for In-memory Computing in Quantized Neural Network AI Applications”, VLSI Symposium on Technology, THL.4, Virtual Conference, June 16, 2020.
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| [24] | C. Jin, T. Saraya, T. Hiramoto and M. Kobayashi, "Transient Negative Capacitance as Cause of Reverse Drain-Induced Barrier Lowering and Negative Differential Resistance in Ferroelectric FETs", VLSI Symposium on Technology, Kyoto, pp. T220 - T221, June 13, 2019.
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| [23] | F. Mo, Y. Tagawa, C. Jin, M. Ahn, T. Saraya, T. Hiramoto and M. Kobayashi, "Experimental Demonstration of Ferroelectric HfO2 FET with Ultrathin-Body IGZO for High-Density and Low-Power Memory Application", VLSI Symposium on Technology, Kyoto, pp. T42 - T43, June 11, 2019.
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| [22] | K. Kakushima, T. Hoshii, M. Watanabe1 N. Shigyo, K. Furukawa, T. Saraya, T. Takakura, K. Itou, M. Fukui, S. Suzuki, K. Takeuchi, I. Muneta, H. Wakabayashi, Y. Numasawa, A. Ogura, S. Nishizawa, K. Tsutsui, T. Hiramoto, H. Ohashi, and H. Iwai, “New methodology for evaluating minority carrier lifetime for process assessment”, VLSI Symposium on Technology, Hilton Hawaiian Village, Honolulu, HI, USA, pp. C105 - C106, June, 2018.
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| [21] | Masaharu Kobayashi, Nozomu Ueyama and Toshiro Hiramoto, “A Nonvolatile SRAM Integrated with Ferroelectric HfO2 Capacitor for Normally-Off and Ultralow Power IoT Application”, Symposium on VLSI Technology, Rihga Royal Hotel Kyoto, Kyoto, pp. T156 – T157, June 7, 2017.
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| [20] | Hao Qiu, Kiyoshi Takeuchi, Tomoko Mizutani, Takuya Saraya, Jiezhi Chen, Masaharu Kobayashi, and Toshiro Hiramoto, “Statistical Analyses of Random Telegraph Noise Amplitude in Ultra-Narrow (Deep Sub-10nm) Silicon Nanowire Transistors”, Symposium on VLSI Technology, Rihga Royal Hotel Kyoto, Kyoto, pp. T50 – T51, June 6, 2017.
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| [19] | Masaharu Kobayashi and Toshiro Hiramoto, “Device Design Guideline for Steep Slope Ferroelectric FET Using Negative Capacitance in Sub-0.2V Operation: Operation Speed, Material Requirement and Energy Efficiency”, VLSI Symposium on Technology, Rihga Royal Hotel Kyoto, Kyoto, pp. T212 - T213, June 18, 2015.
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| [18] | Y. Yamamoto, H. Makiyama, T. Yamashita, H. Oda, S. Kamohara, N. Sugii, Y. Yamaguchi, T. Mizutani, M. Kobayashi and T. Hiramoto, “Novel Single p+Poly-Si/Hf/SiON Gate Stack Technology on Silicon-on-Thin-Buried-Oxide (SOTB) for Ultra-Low Leakage Applications”, VLSI Symposium on Technology, Rihga Royal Hotel Kyoto, Kyoto, pp. T170 - T171, June 17, 2015.
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| [17] | Hao Qiu, Tomoko Mizutani, Yoshiki Yamamoto, Hideki Makiyama, Tomohiro Yamashita, Hidekazu Oda, Shiro Kamohara, Nobuyuki Sugii, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “Impact of Random Telegraph Noise on Write Stability in Silicon-on-Thin-BOX (SOTB) SRAM Cells at Low Supply Voltage in Sub-0.4V Regime”, VLSI Symposium on Technology, Rihga Royal Hotel Kyoto, Kyoto, pp. T38 - T39, June 16,2015.
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| [16] | Akitsugu Ueda, Seung-Min Jung, Tomoko Mizutani, Anil Kumar, Takuya Saraya, and Toshiro Hiramoto, "Ultra-Low Voltage (0.1V) Operation of Vth Self-Adjusting MOSFET and SRAM Cell", VLSI Symposium on Technology, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 198 - 199, June 12, 2014.
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| [15] | Shiro Kamohara, Nobuyuki Sugii, Yoshiki Yamamoto, Hideki Makiyama, Tomohiro Yamashita, Takumi Hasegawa, Shinobu Okanishi, Hiroshi Yanagita, Masaru Kadoshima, Keiichi Maekawa, Hitoshi Mitani, Yasushi Yamagata, Hidekazu Oda, Yasuo Yamaguchi, Koichiro Ishibashi, Hideharu Amano, Kimiyoshi Usami, Kazutoshi Kobayashi, Tomoko Mizutani, Toshiro Hiramoto (Invited), "Ultralow-Voltage Design and Technology of Silicon-on-Thin-Buried-Oxide (SOTB) CMOS for Highly Energy Efficient Electronics in IoT Era", VLSI Symposium on Technology, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 190 - 191, June 12, 2014.
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| [14] | Y. Yamamoto, H. Makiyama, H. Shinohara, T. Iwamatsu, H. Oda, S. Kamohara, N. Sugii, Y. Yamaguchi, T. Mizutani and T. Hiramoto, "Ultralow-Voltage Operation of Silicon-on-Thin-BOX (SOTB) 2Mbit SRAM Down to 0.37 V Utilizing Adaptive Back Bias", VLSI Symposium on Technology, pp. T212 - T213, June 13, 2013.
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| [13] | Y. Yamamoto, H. Makiyama, T. Tsunomura, T. Iwamatsu, H. Oda, N. Sugii, Y. Yamaguchi, T. Mizutani and T. Hiramoto, "Poly/High-k/SiON Gate Stack and Novel Profile Engineering Dedicated for Ultralow-Voltage Silicon-on-Thin-BOX (SOTB) CMOS Operation", Symposium on VLSI Technology, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 109 - 110, June 11, 2012.
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| [12] | K. Takeuchi, A. Nishida, S. Kamohara, T. Hiramoto and T. Mogami, "Proposal of a Model for Increased NFET Random Fluctuations", Symposium on VLSI Technology, Rihga Royal Hotel Kyoto, pp. 192 - 193, June 16, 2011.
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| [11] | T. Tsunomura, J. Nishimura, A. Kumar, A. Nishida, S. Inaba, K. Takeuchi, T. Hiramoto and T. Mogami, "Suppression of VT Variability Degradation Induced by NBTI with RDF Control", Symposium on VLSI Technology, Rihga Royal Hotel Kyoto, pp. 150 - 151, June 15, 2011.
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| [10] | M. Suzuki, T. Saraya, K. Shimizu, A. Nishida, S. Kamohara, K. Takeuchi, S. Miyano, T. Sakurai, and T. Hiramoto, "Direct Measurements, Analysis, and Post-Fabrication Improvement of Noise Margins in SRAM Cells Utilizing DMA SRAM TEG", VLSI Symposium on Technology, Hilton Hawaiian Village, HI. USA, pp. 191 - 192, June 17, 2010.
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| [9] | Jiezhi Chen, Takuya Saraya, and Toshiro Hiramoto, "Mobility Enhancement over Universal Mobility in (100) Silicon Nanowire Gate-All-Around MOSFETs with Width and Height of Less Than 10nm Range", VLSI Symposium on Technology, Hilton Hawaiian Village, HI. USA, pp. 175 - 176, June 17, 2010.
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| [8] | T. Tsunomura, A. Kumar, T. Mizutani, C. Lee, A. Nishida, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Hiramoto, T. Mogami, "Analysis and Prospect of Local Variability of Drain Current in Scaled MOSFETs by a New Decomposition Method", VLSI Symposium on Technology, Hilton Hawaiian Village, HI. USA, pp. 97 - 98, June 16, 2010.
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| [7] | Makoto Suzuki, Takuya Saraya, Ken Shimizu, Takayasu Sakurai, and Toshiro Hiramoto, "Post-Fabrication Self-Convergence Scheme for Suppressing Variability in SRAM Cells and Logic Transistors", Symposium on VLSI Technology, Rihga Royal Hotel Kyoto, pp. 148 - 149, June 16, 2009.
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| [6] | A. T. Putra, T. Tsunomura, A. Nishida, S. Kamohara, K. Takeuchi, S. Inaba, K. Terada, and T. Hiramoto, "A New Methodology for Evaluating VT Variability Considering Dopant Depth Profile", Symposium on VLSI Technology, Rihga Royal Hotel Kyoto, pp. 116 - 117, June 16, 2009.
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| [5] | T. Tsunomura, A. Nishida, F. Yano, A. T. Putra, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Mama, T. Hiramoto, T. Mogami, "Analysis of Extra VT Variability Sources in NMOS Using Takeuchi Plot", Symposium on VLSI Technology, Rihga Royal Hotel Kyoto, pp. 110 - 111, June 16, 2009.
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| [4] | (259) Jiezhi Chen, Takuya Saraya, and Toshiro Hiramoto, "High Hole Mobility in Multiple Silicon Nanowire Gate-All-Around pMOSFETs on (110) SOI", Symposium on VLSI Technology, Rihga Royal Hotel Kyoto, pp. 90 - 91, June 16, 2009.
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| [3] | T. Tsunomura, A. Nishida, F. Yano, A. T. Putra, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Hiramoto, and T. Mogami, "Analyses of 5ƒÐ Vth Fluctuation in 65nm-MOSFETs Using Takeuchi Plot", Symposium on VLSI Technology, pp. 156 - 157, Hilton Hawaiian Village, HI, USA, June 19, 2008.
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| [2] | Jiezhi Chen, Takuya Saraya, Kousuke Miyaji, Ken Shimizu, and Toshiro Hiramoto, "Experimental Study of Mobility in [110]- and [100]-Directed Multiple Silicon Nanowire GAA MOSFETs on (100) SOI", Symposium on VLSI Technology, pp. 32 - 33, Hilton Hawaiian Village, HI, USA, June 17, 2008.
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| [1] | Gen Tsutsui, Masumi Saitoh, and Toshiro Hiramoto, "Superior Mobility Characteristics in (110)-Oriented Ultra Thin Body pMOSFETs with SOI Thickness less than 6 nm", Symposium on VLSI Technology, Rihga Royal Hotel Kyoto, pp. 76 - 77, June, 2005.
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| [16] | Masahide Goto, Yuki Honda, Toshihisa Watabe, Kei Hagiwara, Masakazu Nanba, and Yoshinori Iguchi, Takuya Saraya, Masaharu Kobayashi, Eiji Higurashi, Hiroshi Toshiyoshi and Toshiro Hiramoto (Invited), “Pixel-Parallel 3D Integrated CMOS Image Sensors Developed by Direct Bonding of SOI Layers for Next-Generation Video Systems”, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Hyatt Regency San Francisco Airport, Burlingame, CA, USA, October 17, 2018.
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| [15] | Masahide Goto, Yuki Honda, Toshihisa Watabe, Kei Hagiwara, Masakazu Nanba, Yoshinori Iguchi, Takuya Saraya, Masaharu Kobayashi, Eiji Higurashi, Hiroshi Toshiyoshi and Toshiro Hiramoto, “In-Pixel A/D Converters with 120-dB Dynamic Range Using Event-Driven Correlated Double Sampling for Stacked SOI Image Sensors”, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Hyatt Regency San Francisco Airport, Burlingame, CA, USA, October 12, 2016.
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| [14] | Seung-Min Jung, Takuya Saraya, Kiyoshi Takeuchi, Masaharu Kobayashi and Toshiro Hiramoto, “Vth Self-Adjusting Tri-Gate Nanowire MOSFET for Stability Improvement of SRAM Cell Operating at 0.1 V”, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), The DoubleTree by Hilton Sonoma Wine Country, Rohnert Park, CA, USA, Paper 11.4, October 6, 2015.
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| [13] | Masahide Goto, Kei Hagiwara, Yuki Honda, Masakazu Nanba, Hiroshi Ohtake, Yoshinori Iguchi, Takuya Saraya, Masaharu Kobayashi, Eiji Higurashi, Hiroshi Toshiyoshi, and Toshiro Hiramoto, “128 × 96 Pixel-Parallel Three-Dimensional Integrated CMOS Image Sensors with 16-bit A/D Converters by Direct Bonding with Embedded Au Electrodes”, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), The DoubleTree by Hilton Sonoma Wine Country, Rohnert Park, CA, USA, Paper 7c.3, October 5, 2015.
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| [12] | M. Goto, K. Hagiwara, Y. Iguchi, H. Ohtake, T. Saraya, E. Higurashi, H. Toshiyoshi, and T. Hiramoto, "Three-Dimensional Integrated Circuits with NFET and PFET on Separate Layers Fabricated by Low Temperature Au/SiO2 Hybrid Bonding", IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Hyatt Regency Monterey Hotel and Spa, Monterey, CA, USA, Paper 11.2, October 10, 2013.
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| [11] | N. Sugii, T. Iwamatsu, Y. Yamamoto, H. Makiyama, H. Shinohara, H. Oda, S. Kamohara, Y. Yamaguchi, K. Ishibashi, T. Mizutani, and T. Hiramoto (Invited), "Vmin=0.4 V LSIs are the real with Silicon-on-Thin-Buried-Oxide (SOTB) -How is the application with "Perpetuum-Mobile" micro-controller with SOTB?", IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Hyatt Regency Monterey Hotel and Spa, Monterey, CA, USA, Paper 8b.1, October 10, 2013.
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| [10] | T. Hiramoto, T. Mizutani, A. Kumar, A. Nishida, T. Tsunomura, S. Inaba, K. Takeuchi, S. Kamohara, and T. Mogami, "Suppression of DIBL and Current-Onset Voltage Variability in Intrinsic Channel Fully Depleted SOI MOSFETs", IEEE International SOI Conference, San Diego, CA, USA, pp. 170 - 171, October 14, 2010.
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| [9] | Ken Shimizu, Takuya Saraya and Toshiro Hiramoto, "Superior <110>-Directed Mobility to <100>-Directed Mobility in Ultrathin Body (110) nMOSFETs", IEEE International SOI Conference, Crowne Plaza Hotel, Foster City, CA, USA, No. 11.4, October 9, 2009.
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| [8] | Ken Shimizu and Toshiro Hiramoto, "Suppression of Electron Mobility Degradation in (100)-Oriented Double-Gate Ultra-Thin Body nMOSFETs with SOI Thickness of Less Than 2 nm", IEEE International SOI Conference, Miramonte Resort & Spa, Indian Wells, CA, USA, pp. 145 - 146, October 4, 2007.
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| [7] | Ken Shimizu, Gen Tsutsui, and Toshiro Hiramoto, "Experimental Study on Mobility Universality in (100) Ultra Thin Body nMOSFET with SOI Thickness of 5nm", 2006 IEEE International SOI Conference, Niagara Falls, NY, USA, pp. 159 - 160, October, 2006.
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| [6] | Tetsu Ohtou, Kouki Yokoyama, Toshiharu Nagumo and Toshiro Hiramoto, "Vth Control of tpd-Degradation-Free FD SOI MOSFET with Extremely Thin BOX Using Variable Body-Factor Scheme", IEEE International SOI Conference, Hyatt Regency Waikiki Resort & Spa, Honolulu, Hawaii, USA, pp. 101 - 103, October, 2005.
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| [5] | Anil Kumar, Toshiharu Nagumo, Gen Tsutsui and Toshiro Hiramoto "Degradation of Body Factor () of Single Gate Fully Depleted SOI MOSFETs Due to Short Channel Effects", IEEE International SOI Conference, Francis Marion Hotel, Charleston, SC, USA, pp. 58 - 59, October, 2004.
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| [4] | T. Hiramoto (Invited), "Nano-Scale Silicon MOSFET: Towards Non-Traditional and Quantum Devices", 2001 IEEE International SOI Conference, Sheraton Tamarron Resort, Durango, CO, USA, pp. 8 - 10, October, 2001.
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| [3] | T. Saraya and T. Hiramoto, "Mechanisms of dynamic pass leakage current in partially depleted SOI MOSFETs", 1999 IEEE International SOI Conference, Doubletree Hotel Sonoma County, CA, USA, pp. 84 - 85, October, 1999.
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| [2] | Tran Ngoc Duyet, Hiroki Ishikuro, Makoto Takamiya, Takuya Saraya, and Toshiro Hiramoto, "Effects of Body Reverse Pulse Bias on Geometric Component of Charge Pumping Current in FD SOI MOSFETs", 1998 IEEE International SOI Conference, Stuart, Florida, USA, pp. 79 - 80, October, 1998.
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| [1] | T. Saraya, M. Takamiya, T. N. Duyet, T. Tanaka, H. Ishikuro, T. Hiramoto, and T. Ikoma, "Floating Body Effects in 0.15 μm Partially Depleted SOI MOSFETs below 1 V", 1996 IEEE International SOI Conference, Fort Myers, Florida, USA, October, 1996.
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| [62] | Fei Mo, Xiaoran Mei, Takuya Saraya, Toshiro Hiramoto and Masaharu Kobayashi, “Simulation Study on Memory Characteristics of IGZO-Channel FeFET from 2D Planer to 3D Vertical Structure for Channel Structure Engineering”, 2021 International Conference on Solid State Devices and Materials (SSDM), Online Conference, A-8-04, pp. 83 - 84, September 9, 2021.
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| [61] | Zihao Liu, Tomoko Mizutani, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “Width Dependence of Drain Current Variability Components in Extremely Narrow GAA Silicon Nanowire MOSFETs down to 2nm Width”, 2021 International Conference on Solid State Devices and Materials (SSDM), Online Conference, A-7-04, pp. 69 - 70, September 9, 2021.
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| [60] | Hongkuan Yu, Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi and Toshiro Hiramoto, “Distribution Analysis of Minimum Operating Voltage in Fully Depleted SOI SRAM Cells”, 2021 International Conference on Solid State Devices and Materials (SSDM), Online Conference, A-6-09, pp. 59 - 60, September 8, 2021.
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| [59] | Kiyoshi Takeuchi, Tomoko Mizutani, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “A Robust Single Device MOSFET Series Resistance Extraction Method Considering Horizontal-Field-Dependent Mobility”, 2021 International Conference on Solid State Devices and Materials (SSDM), Online Conference, A-6-06, pp. 53 - 54, September 8, 2021.
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| [58] | Masaharu Kobayashi, Fei Mo, Jiawen Xiang, Jixuan Wu, Takuya Saraya and Toshiro Hiramoto (Invited), “Technology Challenge and Opportunity of HfO2-based FeFET Memory”, 2021 International Conference on Solid State Devices and Materials (SSDM), Online Conference, B-6-01, pp. 133 - 134, September 8, 2021.
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| [57] | Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Hiroshi Oka, Takahiro Mori, Masaharu Kobayashi and Toshiro Hiramoto, “Effect of Percolation Path on Temperature Dependence of Threshold Voltage Variability in Bulk MOSFETs”, 2021 International Conference on Solid State Devices and Materials (SSDM), Online Conference, A-1-06, pp. 17 - 18, September 7, 2021.
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| [56] | Min-Ju Ahn, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “Variability and Corner Effect of GAA p-Type Poly-Si Junctionless Nanowire/Nanosheet Transistors”, 2020 International Conference on Solid State Devices and Materials (SSDM), pp. 47 - 48, Virtual Conference, September 29, 2020.
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| [55] | M. Fukui, T. Saraya, K. Itou, T. Takakura, S. Suzuki, K. Takeuchi, K. Kakushima, T. Hoshii, K. Tsutsui, H. Iwai, S. Nishizawa, I. Omura, T. Hiramoto, “Turn-Off Loss Improvement by IGBT Scaling”, 2019 International Conference on Solid State Devices and Materials (SSDM), Nagoya University, pp. 723 - 724, September 4, 2019.
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| [54] | T. Saraya, K. Ito, T. Takakura, M. Fukui, S. Suzuki, K. Takeuchi, K. Kakushima, T. Hoshii, K. Tsutsui, H. Iwai, S. Nishizawa, I. Omura, T. Hiramoto, “Impact of Structural Parameter Scaling on On-state Voltage in 1200V Scaled IGBTs”, 2019 International Conference on Solid State Devices and Materials (SSDM), Nagoya University, pp. 453 - 454, September 4, 2019.
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| [53] | K. Takeuchi, M. Kobayashi, T. Hiramoto, “A Simulation Study on Hf-based Ferroelectric FET Memory Performance”, 2019 International Conference on Solid State Devices and Materials (SSDM), Nagoya University, pp. 375 - 376, September 4, 2019.
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| [52] | T. Mizutani, K. Takeuchi, T. Saraya, M. Kobayashi, T. Hiramoto, “Statistical Analysis of Temperature Dependence of Worst Case SRAM Data Retention Voltage Using Extreme Value Theory”, 2019 International Conference on Solid State Devices and Materials (SSDM), Nagoya University, pp. 561 - 562, September 3, 2019.
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| [51] | H. Kobayashi, R. Yokogawa, K. Kinoshita, Y. Numasawa, A. Ogura, S. Nishizawa, T. Saraya, K. Ito, T. Takakura, S. Suzuki, M. Fukui, K. Takeuchi and T. Hiramoto, “Evaluations of Minority Carrier Lifetime in FZ-Si Affected by Si-IGBT Processes”, 2018 International Conference on Solid State Devices and Materials (SSDM), Hongo Campus, The University of Tokyo, pp. 973-974, September 12, 2018.
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| [50] | Chengji Jin, Toshiro Hiramoto, and Masaharu Kobayashi, “On the Physical Origin of Steep Subthreshold Slope in Ferroelectric FET: Transient Negative Capacitance Effect Caused by Polarization Switching Delay”, 2018 International Conference on Solid State Devices and Materials (SSDM), Hongo Campus, The University of Tokyo, pp. 199-200, September 12, 2018.
|
| [49] | Shuang Gao, Tomoko Mizutani, Kiyoshi Takeuchi, Masaharu Kobayashi, and Toshiro Hiramoto, “Temperature Effect on DIBL Variability in Bulk and SOTB MOSFETs”, 2018 International Conference on Solid State Devices and Materials (SSDM), Hongo Campus, The University of Tokyo, pp. 167-168, September 11, 2018.
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| [48] | K. Kakushima, T. Hoshii, K. Tsutsui, A. Nakajima, S. Nishizawa, H. Wakabayashi, I. Muneta, K. Sato, T. Matsudai, W. Saito, T. Saraya, K. Itou, M. Fukui, S. Suzuki, M. Kobayashi, T. Takakura, T. Hiramoto, A. Ogura, Y. Numasawa, I. Omura, H. Ohashi, and H. Iwai (Invited), “Demonstration of Reduction in Vce(sat) of IGBT based on a 3D Scaling Principle”, International Conference on Solid-State Devices and Materials (SSDM), Sendai International Center, Miyagi, pp. 669 - 670, September 22, 2017.
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| [47] | Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi and Toshiro Hiramoto, “Lowering Minimum Operation Voltage (Vmin) in SRAM Array by Post-Fabrication Self-Improvement of Cell Stability by Multiple Stress Application”, International Conference on Solid State Devices and Materials (SSDM), Sendai International Center, Miyagi, pp. 245 - 246, September 22, 2017.
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| [46] | Daiki Ueda, Kiyoshi Takeuchi, Masaharu Kobayashi, and Toshiro Hiramoto, “Optimizing MOS-Gated Thyristor using Voltage-based Equivalent Circuit Model for Designing Steep Subthreshold Slope PN-Body Tied SOI FET”, International Conference on Solid State Devices and Materials (SSDM), Sendai International Center, Miyagi, pp. 243 - 244, September 22, 2017.
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| [45] | Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Hirofumi Shinohara, Masaharu Kobayashi and Toshiro Hiramoto, “Parallel Programmable Non-volatile Memory Using Normal SRAM Cells”, International Conference on Solid State Devices and Materials (SSDM), Tsukuba International Congress Center, Ibaraki, pp. 57 - 58, September 29, 2016.
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| [44] | Kiyoshi Takeuchi, Tomoko Mizutani, Takuya Saraya, Hirofumi Shinohara, Masaharu Kobayashi and Toshiro Hiramoto, “A Study on the Correlation between SRAM Power-up State and Transistor Variation”, International Conference on Solid State Devices and Materials (SSDM), Tsukuba International Congress Center, Ibaraki, pp. 55 - 56, September 29, 2016.
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| [43] | Tomoko Mizutani, Takuya Saraya, Kiyoshi Takeuchi, Masaharu Kobayashi, and Toshiro Hiramoto, “Transistor-level Characterization of SRAM Bit Failures Induced by Random Telegraph Noise”, International Conference on Solid State Devices and Materials (SSDM), Sapporo Convention Center, Hokkaido, pp. 1010 – 1011, September 29, 2015.
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| [42] | Hao Qiu, Tomoko Mizutani, Takuya Saraya, and Toshiro Hiramoto, "Comparison and Statistical Analysis of Four Write Stability Metrics in Bulk CMOS SRAM Cells", International Conference on Solid State Devices and Materials (SSDM), Tsukuba International Congress Center, Ibaraki, pp. 848 - 849, September 10, 2014.
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| [41] | T. Mizutani, Y. Yamamoto, H. Makiyama, T. Yamashita, H. Oda, S. Kamohara, N. Sugii, and T. Hiramoto, "Detailed Analysis of Minimum Operation Voltage (Vmin) of Extraordinarily Unstable Cells in Fully Depleted Silicon-on-Thin-BOX (SOTB) 6T-SRAM", International Conference on Solid State Devices and Materials (SSDM), Tsukuba International Congress Center, Ibaraki, pp. 846 - 847, September 10, 2014.
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| [40] | T. Mizutani, Y. Yamamoto, H. Makiyama, H. Shinohara, T. Iwamatsu, H. Oda, N. Sugii, and T. Hiramoto, "Comparison of Minimum Operation Voltage (Vmin) in Fully Depleted Silicon-on-Thin-BOX (SOTB) and Bulk SRAM Cells", 2013 International Conference on Solid State Devices and Materials (SSDM), Hilton Fukuoka Sea Hawk, Fukuoka, pp. 742 - 743, September 27, 2013.
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| [39] | N. Sugii, T. Iwamatsu, Y. Yamamoto, H. Makiyama, H. Shinohara, H. Oda, S. Kamohara, Y. Yamaguchi, T. Mizutani, K. Ishibashi, and T. Hiramoto (Invited), "Ultralow-Voltage Operation SOTB Technology toward Energy Efficient Electronics", 2013 International Conference on Solid State Devices and Materials (SSDM), Hilton Fukuoka Sea Hawk, Fukuoka, pp. 736 - 737, September 27, 2013.
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| [38] | Yuma Tanahashi, Ryota Suzuki, Takuya Saraya, and Toshiro Hiramoto, "Peak Position Control of Coulomb Oscillations in Silicon Single-Electron Transistors with Floating Gate Operating at Room Temperature", 2013 International Conference on Solid State Devices and Materials (SSDM), Hilton Fukuoka Sea Hawk, Fukuoka, pp. 778 - 779, September 26, 2013.
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| [37] | T. Mizutani, Y. Yamamoto, H. Makiyama, T. Tsunomura, T. Iwamatsu, H. Oda, N. Sugii, and T. Hiramoto, "Statistical Analysis of Subthreshold Swing in Fully Depleted Silicon-on-Thin-BOX (SOTB) MOSFETs and Bulk MOSFETs", 2012 International Conference on Solid State Devices and Materials (SSDM), Kyoto International Conference Center, Kyoto, September 27, 2012.
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| [36] | Ke Mao, Takuya Saraya, and Toshiro Hiramoto, "The impact of Side Surface Roughness on Carrier Mobility in Tri-Gate Silicon Nanowire MOSFETs", 2012 International Conference on Solid State Devices and Materials (SSDM), Kyoto International Conference Center, Kyoto, September 25, 2012.
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| [35] | Ryota Suzuki, Motoki Nozue, Takuya Saraya, and Toshiro Hiramoto, "Integration of 1-bit CMOS Address Decoders and Single-Electron Transistors Operating at Room Temperature", 2012 International Conference on Solid State Devices and Materials (SSDM), Kyoto International Conference Center, Kyoto, pp. 943 - 944, September 25, 2012. This paper received the SSDM Young Researcher Award.
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| [34] | Ke Mao, Takuya Saraya, and Toshiro Hiramoto, "Extraction of Carrier Mobility in Intrinsic Channel Tri-Gate Single Silicon Nanowire MOSFETs", 2012 International Conference on Solid State Devices and Materials (SSDM), Kyoto International Conference Center, Kyoto, September 25, 2012.
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| [33] | K. Mao, T. Mizutani, A. Kumar, T. Saraya, and T. Hiramoto, "Extremely Small Within-Device Variability in Intrinsic Channel Tri-Gate Silicon Nanowire MOSFETs", 2011 International Conference on Solid State Devices and Materials (SSDM), Aichi Industry & Labor Center (WINC AICHI), no. D-6-3, September 30, 2011.
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| [32] | T. Tsunomura, A. Kumar, T. Mizutani, A. Nishida, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Hiramoto, and T. Mogami, "High Temperature Characteristic of Radom Variability of Drain Current in Scaled FETs", International Conference on Solid-State Devices and Materials (SSDM), University of Tokyo, pp. 699 - 700, September 23, 2010.
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| [31] | T. Tsunomura, A. Nishida, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Hiramoto and T. Mogami (Invited), "Process Condition Dependence of Random VT Variability in NFETs and PFETs", International Conference on Solid State Devices and Materials (SSDM), Sendai Kokusai Hotel, pp. 1010 - 1011, October 9, 2009.
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| [30] | Chiho Lee, Arifin Tamsir Putra, Ken Shimizu, and Toshiro Hiramoto, "Vth Dependence of Vth Variability in Intrinsic Channel SOI MOSFETs with Ultra-Thin BOX", International Conference on Solid State Devices and Materials (SSDM), Sendai Kokusai Hotel, pp. 10 - 11, October 7, 2009.
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| [29] | Ken Shimizu and Toshiro Hiramoto, "Mobility Degradation in (110)-Oriented Ultra-thin Body Double-Gate pMOSFETs with SOI Thickness of less than 5nm", International Conference on Solid State Devices and Materials (SSDM), Tsukuba International Congress Center, pp. 732 - 733, September 20, 2007.
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| [28] | Kousuke Miyaji and Toshiro Hiramoto, "Room Temperature Demonstration of Variable Full Width at Half Maximum of Coulomb Oscillation in Silicon Single-Hole Transistor", International Conference on Solid State Devices and Materials (SSDM), Pacificko Yokohama, pp. 836 - 837, September, 2006.
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| [27] | Masaharu Kobayashi, Kousuke Miyaji, and Toshiro Hiramoto, "Charge Polarity Dependence of Negative Differential Conductance in Room-Temperature Operating Silicon Single-Charge Transistors", International Conference on Solid State Devices and Materials (SSDM), Pacificko Yokohama, pp. 806 - 807, September, 2006.
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| [26] | Doni Januar, Gen Tsutsui, Masumi Saitoh, and Toshiro Hiramoto, "Mobility Increase in High-Ns Region in (110)-Oriented UTB pMOSFET Through Surface Roughness Improvement", International Conference on Solid State Devices and Materials (SSDM), International Conference Center Kobe, Hyogo, pp. 264 - 265, September, 2005.
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| [25] | Masaharu Kobayashi, Masumi Saitoh, and Toshiro Hiramoto, "Large Temperature Dependence of Coulomb Blockade Oscillations in Room-Temperature Operating Silicon Single-Hole Transistor", International Conference on Solid State Devices and Materials (SSDM), International Conference Center Kobe, Hyogo, pp. 164 - 165, September, 2005.
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| [24] | Arifin Tamsir, Masumi Saitoh, Gen Tsutsui and Toshiro Hiramoto, "Modeling of Body Factor and Subthreshold Swing in Short Channel Bulk MOSFETs", International Conference on Solid State Devices and Materials (SSDM), International Conference Center Kobe, Hyogo, pp. 184 - 285, September, 2005.
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| [23] | Kousuke Miyaji, Masumi Saitoh, and Toshiro Hiramoto, "Very Sharp Room-Temperature Negative Differential Conductance in Silicon Single-Hole Transistor with High Voltage Gain", International Conference on Solid State Devices and Materials (SSDM), International Conference Center Kobe, Hyogo, pp. 166 - 167, September, 2005.
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| [22] | Sangsu Park, Hyunsik Im, Ilgweon Kim, and Toshiro Hiramoto, "Impact of Drain Induced Barrier Lowering on Read Scheme in Silicon Nanocrystal Memory with Two-Bit-per-Cell Operation", International Conference on Solid State Devices and Materials, Tower Hall Funabori, Tokyo, pp. 610 - 611, September, 2004.
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| [21] | Kosuke Yanagidaira, Masumi Saitoh, and Toshiro Hiramoto, "Large Threshold Voltage Shift and Narrow Threshold Voltage Distribution in Ultra Thin Body Silicon Nanocrystal Memories", International Conference on Solid State Devices and Materials, Tower Hall Funabori, Tokyo, pp. 130 - 131, September, 2004.
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| [20] | Kouske Miyaji, Masumi Saitoh, Toshiharu Nagumo, and Toshiro Hiramoto, "Temperature Dependence of Off-Current in Bulk and FD SOI MOSFETs," International Conference on Solid State Devices and Materials, Tower Hall Funabori, Tokyo, pp. 236 - 237, September, 2004.
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| [19] | Fumihiko Tachibana and Toshiro Hiramoto, "Re-examination of Impact of Intrinsic Dopant Fluctuations on SRAM Static Noise Margin", International Conference on Solid State Devices and Materials, Tower Hall Funabori, Tokyo, pp. 192 - 193, September, 2004.
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| [18] | Tetsu Ohtou, Toshiharu Nagumo, and Toshiro Hiramoto, "Short Channel Characteristics of Variable Body Factor FD SOI MOSFETs", International Conference on Solid State Devices and Materials, Tower Hall Funabori, Tokyo, pp. 502 - 503, September, 2004.
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| [17] | Masumi Saitoh, Hidehiro Harata, and Toshiro Hiramoto, "Room Temperature Demonstration of Low-Voltage Static Memory Based on Negative Differential Conductance in Silicon Single-Hole Transistors", International Conference on Solid State Devices and Materials, Tower Hall Funabori, Tokyo, pp. 124 - 125, September, 2004. This paper received the SSDM Young Researcher Award.
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| [16] | M. Saitoh and T. Hiramoto, "Room-Temperature Observation of Negative Differential Conductance Due to Large Quantum Level Spacing in Silicon Single-Electron Transistor", 2003 International Conference on Solid State Devices and Materials (SSDM), Keio Plaza Hotel, pp. 328 - 329, September, 2003.
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| [15] | T. Ohtou, T. Nagumo, and T. Hiramoto, "Variable Body Effect Factor FD SOI MOSFET for Ultra-Low Power VTCMOS Applications", 2003 International Conference on Solid State Devices and Materials (SSDM), Keio Plaza Hotel, pp. 272 - 273, September, 2003.
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| [14] | T. Nagumo, and T. Hiramoto, "Current Drive Improvement by Enhanced Body Effect Factor Due to Finite Inversion Layer Thickness in Variable Threshold Voltage CMOS", 2002 International Conference on Solid State Devices and Materials (SSDM), Nagoya Congress Center, pp. 798 - 799, September, 2002.
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| [13] | T. Hiramoto (Invited), "Future Electron Devices and SOI Technology", 2002 International Conference on Solid State Devices and Materials (SSDM), Nagoya Congress Center, pp. 780 - 781, September, 2002.
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| [12] | Q. Liu, T. Sakurai, and T. Hiramoto, "Optimum Device Consideration for Standby Power Reduction Scheme Using Drain Induced Barrier Lowering (DIBL)", 2002 International Conference on Solid State Devices and Materials (SSDM), Nagoya Congress Center, pp. 258 - 259, September, 2002.
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| [11] | M. Saitoh, H. Majima, and T. Hiramoto, "Tunneling Barrier Structure in Room-Temperature Operating Silicon Single-Electron and Single-Hole Transistors", 2002 International Conference on Solid State Devices and Materials (SSDM), Nagoya Congress Center, pp. 108 - 109, September, 2002.
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| [10] | Takashi Inukai, Hyunsik Im, and Toshiro Hiramoto, "Origin of Critical Substrate Bias in Variable Threshold Voltage CMOS", 2001 International Conference on Solid State Devices and Materials (SSDM), Diamond Hotel, Tokyo, pp. 106 - 107, September, 2001.
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| [9] | T. Hiramoto (Invited), "Optimum Device Parameters and Scalability of Variable Threshold CMOS (VTCMOS)", 2000 International Conference on Solid State Devices and Materials (SSDM), Sendai, Japan, pp. 372 - 373, August, 2000.
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| [8] | H. Koura, M. Takamiya, and T. Hiramoto, "Optimum Conditions of Body Effect Factor and Substrate Bias in Variable Threshold Voltage MOSFETs", 1999 International Conference on Solid State Devices and Materials (SSDM'99), Tokyo, Japan, pp. 446 - 447, September, 1999.
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| [7] | T. Inukai and T. Hiramoto, "Suppression of Stand-by Tunnel Current in Ultra-Thin-Gate Oxide MOSFETs by Dual Oxide Thickness MTCMOS (DOT-MTCMOS)", 1999 International Conference on Solid State Devices and Materials (SSDM'99), Tokyo, Japan, pp. 264 - 265, September, 1999.
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| [6] | N. Takahashi, H. Ishikuro, and T. Hiramoto, "Characteristics of Silicon Single Electron Transistors Controlled by Charge Injection into Silicon Nano-Crystal Floating Dots", 1999 International Conference on Solid State Devices and Materials (SSDM'99), Tokyo, Japan, pp. 236 - 237, September, 1999.
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| [5] | Tran Ngoc Duyet, Hiroki Ishikuro, Yi Shi, Takuya Saraya, Makoto Takamiya, and Toshiro Hiramoto, "Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs", 1998 International Conference on Solid State Devices and Materials (SSDM'98), International Conference Center Hiroshima, Hiroshima, Japan, pp. 322 - 323, September, 1998.
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| [4] | Makoto Takamiya, Takuya Saraya, Tran Ngoc Duyet, Yuri Yasuda, and Toshiro Hiramoto, "High Performance Accumulated Back-Interface Dynamic Threshold SOI MOSFET's (AB-DTMOS) with Large Body Effect at Low Supply Voltage", 1998 International Conference on Solid State Devices and Materials (SSDM'98), International Conference Center Hiroshima, Hiroshima, Japan, pp. 312 - 313, September, 1998. This paper received the SSDM Young Researcher Award.
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| [3] | Yi Shi, Kenichi Saito, Hiroki Ishikuro, and Toshiro Hiramoto, "Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals", 1998 International Conference on Solid State Devices and Materials (SSDM'98), International Conference Center Hiroshima, Hiroshima, Japan, pp. 172 - 173, September, 1998.
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| [2] | T. Saraya, M. Takamiya, T.N. Duyet, and T. Hiramoto, "New Measurement Technique of Sub-Bandgap Impact Ionization Current by Transient Characteristics of Partially Depleted SOI MOSFETs", 1997 International Conference on Solid State Devices and Materials (SSDM'97), Act City Hamamatsu, Hamamatsu, Japan, pp. 554 - 555, September, 1997.
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| [1] | H. Ishikuro, T. Saraya, T. Hiramoto, and T. Ikoma, "Extremely Large Amplitude of Random Telegram Signals in a Very Narrow Split-Gate MOSFET at Low Temperatures", International Conference on Solid State Devices and Materials (SSDM), pp. 342 - 345, Osaka, Japan, August, 1995.
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| [67] | Jiawen Xiang, Wen Hsin Chang, Takuya Saraya, Toshiro Hiramoto, Toshifumi Irisawa, Masaharu Kobayashi, “Experimental Demonstration of HfO2-based Ferroelectric FET with MoS2 Channel for High-Density and Low-Power Memory Application”, Silicon Nanoelectronics Workshop, Online Conference, S3-2, June 13, 2021. This paper received the Best Student Paper Award.
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| [66] | Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi, Toshihiro Hiramoto, “Statistical analysis of characteristics variability in bulk MOSFETs at Cryogenic Temperature”, Silicon Nanoelectronics Workshop, Online Conference, S2-7, June 13, 2021.
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| [65] | Zihao Liu, Tomoko Mizutani, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto, “Analysis of Drain Current Variability Components in Extremely Narrow GAA Silicon Nanowire MOSFETs of 4nm Width”, Silicon Nanoelectronics Workshop, Online Conference, S2-4, June 13, 2021.
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| [64] | Kiyoshi Takeuchi, Tomoko Mizutani, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto, “A Charge-Based Analytical Threshold Voltage Definition Applicable to Cryogenic Temperatures”, Silicon Nanoelectronics Workshop, Online Conference, S2-3, June 13, 2021.
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| [63] | Min-Ju Ahn, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “Superior subthreshold slope of gate-all-around (GAA) p-type poly-Si junctionless nanowire transistors with highly suppressed grain boundary defects”, IEEE Silicon Nanoelectronics Workshop, pp. 55 - 56, Virtual Conference, June 13, 2020.
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| [62] | Min-Ju Ahn, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “Performance enhancement of BF2+ implanted poly-Si junctionless transistors by boron segregation and fluorine effect”, IEEE Silicon Nanoelectronics Workshop, pp. 51 - 52, Virtual Conference, June 13, 2020.
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| [61] | Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “Integrated Circuits Composed of Nanowire and Single-Electron Transistors Operating at Room Temperature”, IEEE Silicon Nanoelectronics Workshop, pp. 33 - 34, Virtual Conference, June 13, 2020.
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| [60] | T. Mizutani, K. Takeuchi, T. Saraya, M. Kobayashi, T. Hiramoto, "Application of Extreme Value Theory to Statistical Analyses of Worst Case SRAM Data Retention Voltage", Silicon NanoelectronicsWorkshop, Kyoto, June 9, 2019.
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| [59] | T. Mizutani, K. Takeuchi, T. Saraya, M. Kobayashi, T. Hiramoto, “Multiple Stress Technique for Post-Fabrication Cell Stability Self-Improvement of Bulk SRAM Cell Array”, IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 143 - 144, June 18, 2018.
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| [58] | K. -H. Jang, T. Saraya, M. Kobayashi, N. Sawamoto, A. Ogura, T. Hiramoto, “Improving Performance and Variability of Gate-All-Around Polycrystalline Silicon Nanowire Transistors by High Temperature Annealing with Passivation Oxide”, IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 59 - 60, June 17, 2018.
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| [57] | M. Kobayashi, Y. Tagawa, M. Fei, T. Saraya, T. Hiramoto, “Device and Process Design for HfO2-Based Ferroelectric Tunnel Junction Memory with Large Tunneling Electroresistance Effect and Multi-level Cell”, IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 29 - 30, June 17, 2018.
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| [56] | S. Gao, T. Mizutani, K. Takeuchi, M. Kobayashi, T. Hiramoto, “Reduced Subthreshold Slope Variability at High Temperature in Bulk and SOTB MOSFETs”, IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 9 - 10, June 17, 2018.
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| [55] | Ki-Hyun Jang, Takuya Saraya, Masaharu Kobayashi, Naomi Sawamoto, Atsushi Ogura, and Toshiro Hiramoto, “Characteristics Variability of Gate-All-Around Polycrystalline Silicon Nanowire Transistors with Width of 10nm Scale”, Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, pp. 33 - 34, June 4, 2017.
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| [54] | Kyungmin Jang. Nozomu Ueyama, Masaharu Kobayashi, and Toshiro Hiramoto, “Investigations on Dynamic Characteristics of Ferroelectric HfO2 Based on Multi-Domain Interaction Model”, Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, pp. 15 - 16, June 4, 2017.
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| [53] | Daiki Ueda Kiyoshi Takeuchi, Masaharu Kobayashi, and Toshiro Hiramoto, “Carrier-Separated Equivalent Circuit Modeling for Steep Subthreshold Slope PN-Body Tied SOI FET”, Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, pp. 13 - 14, June 4, 2017.
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| [52] | Kyungmin Jang, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “On Gate Stack Scalability of Double-Gate Negative-Capacitance FET with Ferroelectric HfO2 for Energy-Efficient Sub-0.2V Operation”, IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 176 - 177, June 13, 2016.
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| [51] | Masaharu Kobayashi, Kyungmin Jang, Nozomu Ueyama, and Toshiro Hiramoto, “Negative Capacitance as a Performance Booster for Tunnel FET”, IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 150 - 151, June 13, 2016.
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| [50] | Toshiro Hiramoto, Kiyoshi Takeuchi, and Masaharu Kobayashi (Invite), “Ultra-Low Power and Ultra-Low Voltage Devices and Circuits for IoT Applications”, IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 146 - 147, June 13, 2016.
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| [49] | Tomoko Mizutani, Kiyoshi Takeuchi, Ryota Suzuki, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “Increased Drain-Induced Variability and Within-Device Variability in Extremely Narrow Silicon Nanowire MOSFETs with Width down to 2nm”, IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 138 - 139, June 13, 2016.
|
| [48] | T. Mizutani, Y. Tanahashi, R. Suzuki, T. Saraya, M. Kobayashi, and T. Hiramoto, “Threshold Voltage and Current Variability of Extremely Narrow Silicon Nanowire MOSFETs with Width down to 2nm”, Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, pp. 21 - 22, June 14, 2015.
|
| [47] | Tomoko Mizutani, Yoshiki Yamamoto, Hideki Makiyama, Tomohiro Yamashita, Hidekazu Oda, Shiro Kamohara, Nobuyuki Sugii, and Toshiro Hiramoto, "Statistical Analysis of Minimum Operation Voltage (Vmin) in Fully Depleted Silicon-on-Thin-BOX (SOTB) SRAM Cells", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 166 - 167, June 9, 2014.
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| [46] | Seung-Min Jung, Takuya Saraya, and Toshiro Hiramoto, "Analysis of Delay Time in Subthreshold CMOS Circuits Operating at Ultra-Low Supply Voltage", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 87 - 88, June 9, 2014.
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| [45] | Nurul Ezaila Alias, Tomoko Mizutani, Anil Kumar, Takuya Saraya, and Toshiro Hiramoto, "Recovery and Permanent Components of |Vth| Shifts in pFETs by High-Voltage ON-state Stress", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 81 - 82, June 8, 2014.
|
| [44] | Hitoshi Ohno, Tomoko Mizutani, Takuya Saraya, and Toshiro Hiramoto, "Comparison of Statistical Distributions of Random Telegraph Noise (RTN) in Subthreshold Region and Strong Inversion Region", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 33 - 34, June 8, 2014.
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| [43] | Nurul Ezaila Alias, Anil Kumar, Takuya Saraya, Shinji Miyano, and Toshiro Hiramoto, "Variability and Recovery Behaviors of |Vth| Shift of pFETs by High-Voltage OFF-State and ON-State Stress for Post-Fabrication SRAM Cell Stability Self-Improvement", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 33 - 34, June 9, 2013.
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| [42] | Anil Kumar, Takuya Saraya1, Shinji Miyano, and Toshiro Hiramoto, "SRAM Cell Stability Parameter: Noise Margin or Vmin?", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 31 - 32, June 9, 2013.
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| [41] | T. Mizutani, Y. Yamamoto, H. Makiyama, H. Shinohara, T. Iwamatsu, H. Oda, N. Sugii, and T. Hiramoto, "Reduced Cell Current Variability in Fully Depleted Silicon-on-Thin-BOX (SOTB) SRAM Cells at Supply Voltage of 0.4V", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 29 - 30, June 9, 2013.
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| [40] | Seung-Min Jung, Tomoko Mizutani, and Toshiro Hiramoto, "Impact of Drain-Induced Barrier Lowering on Ultra-Low Supply Voltage CMOS Circuits Operating in Subthreshold Region", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 23 - 24, June 9, 2013.
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| [39] | T. Mizutani, Y. Yamamoto, H. Makiyama, T. Tsunomura, T. Iwamatsu, H. Oda, N. Sugii, and T. Hiramoto, "Reduced Drain Current Variability in Fully Depleted Silicon-on-Thin-BOX (SOTB) MOSFETs", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 71 - 72, June 11, 2012.
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| [38] | Ryota Suzuki, Motoki Nozue, Takuya Saraya, and Toshiro Hiramoto, "Reinvestigation of Dot Formation Mechanisms in Silicon Nanowire Channel Single-Electron/Hole Transistors Operating at Room Temperature", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 57 - 58, June 11, 2012.
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| [37] | Anil Kumar, Takuya Saraya, Shinji Miyano, and Toshiro Hiramoto, "Self-Improvement of Cell Stability in SRAM by Post Fabrication Technique", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI. USA, pp. 79 - 80, June 10, 2012.
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| [36] | A. Kumar, T. Mizutani, T. Tsunomura, A. Nishida, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Mogami, T. Hiramoto , "Statistical Analysis of DIBL and Current-Onset Voltage (COV) Variability in Scaled MOSFETs", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 13 - 14, June 12, 2011.
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| [35] | T. Mizutani, A. Kumar, T. Tsunomura, A. Nishida, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Mogami, and T. Hiramoto , "Evaluation of Variability in High-k/Metal-Gate MOSFETs Using Takeuchi Plot", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 11 - 12, June 12, 2011.
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| [34] | T. Mizutani, A. Kumar, T. Tsunomura, A. Nishida, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Hiramoto, "Statistic Characteristics of "Current-Onset Voltage" in Scaled MOSFETs Analyzed by 8k DMA TEG", IEEE Silicon Nanoelectronics Workshop, J Hilton Hawaiian Village, HI. USA, pp. 81 - 82, June 13, 2010.
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| [33] | A. Kumar, T. Mizutani, K. Shimizu, T. Tsunomura, A. Nishida, K. Takeuchi, S. Inaba, S. Kamohara, K. Terada, T. Hiramoto, "Origin of "Current-Onset Voltage" Variability in Scaled MOSFETs", IEEE Silicon Nanoelectronics Workshop, J Hilton Hawaiian Village, HI. USA, pp. 7 - 8, June 13, 2010.
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| [32] | Ryota Suzuki, Yeon-Joo Jeong, Takuya Saraya, and Toshiro Hiramoto, "Automatic Characteristics Control of Single-Electron Transistors in Collaboration with CMOS Digital Circuits" Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 157 - 158, June 14, 2009.
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| [31] | Ichiro Yamato, Arifin Tamsir Putra, and Toshiro Hiramoto, "Impact of Lateral Dopant Profile on Threshold Voltage Variability in Scaled MOSFETs", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 35 - 36, June 13, 2009.
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| [30] | Yeon Joo Jeong, Kousuke Miyaji, and Toshiro Hiramoto, "Experimental Study on Silicon Nanowire nMOSFET and Single-Electron Transistor at Room Temperature under Uniaxial Tensile Strain", IEEE Silicon Nanoelectronics Workshop, M0930, Hilton Hawaiian Village, HI, USA, June 16, 2008.
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| [29] | Arifin Tamsir Putra, Takaaki Tsunomura, Akio Nishida , Shiro Kamohara, Kiyoshi Takeuchi, and Toshiro Hiramoto, "Impact of Atomic Oxide Roughness and Local Gate Depletion on Vth Variation in MOSFETs", IEEE Silicon Nanoelectronics Workshop, S1205, Hilton Hawaiian Village, HI, USA, June 15, 2008.
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| [28] | Ken Shimizu and Toshiro Hiramoto, "Hole Mobility Enhancement by [110] Uniaxial Compressive Strain in (110) Oriented Ultra-Thin Body pFETs with SOI Thickness of Less Than 4 nm", IEEE Silicon Nanoelectronics Workshop, S1135, Hilton Hawaiian Village, HI, USA, June 15, 2008.
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| [27] | J. S. Park, T. Saraya, K. Miyaji, K. Shimizu, A. Higo, K. Takahashi, Y. Yi, H. Toshiyoshi, and T. Hiramoto, "Characteristic Modulation of Silicon MOSFETs and Single Electron Transistors with a Movable Gate Electrode", IEEE Silicon Nanoelectronics Workshop, S1015, Hilton Hawaiian Village, HI, USA, June 15, 2008.
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| [26] | Keisuke Takahashi, Tetsu Ohtou, Arifin Tamsir Putra, Ken Shimizu, and Toshiro Hiramoto, "Body Factor and Leakage Current Reduction in Bulk FinFETs", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 95 - 97, June, 2007.
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| [25] | Arifin Tamsir Putra, Akio Nishida, Shiro Kamohara and Toshiro Hiramoto, "Random Vth Variation Induced by Gate Edge Fluctuations in Nanoscale MOSFETs", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 73 - 74, June, 2007.
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| [24] | S. Lee, K. Miyaji, M. Kobayashi, and T. Hiramoto, "Novel Long-Range-Extension of Coulomb Blockade Region in Room-Temperature Operating Silicon Single-Hole Transistor", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 115 - 116, June, 2007.
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| [23] | Arifin Tamsir Putra, Tetsu Ohtou, and Toshiro Hiramoto, "Critical Substrate Bias in Variable-Threshold Voltage CMOS with Short Channel FD SOI MOSFETs",IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI, USA, pp. 159 - 160, June, 2006.
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| [22] | K. Shimizu, G. Tsutsui, D. Januar, T. Saraya and T. Hiramoto, "Experimental Study on Breakdown of Mobility Universality in <100>-Directed (110)-Oriented pMOSFETs",IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI, USA, pp. 11 - 12, June, 2006.
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| [21] | Tetsu Ohtou, Nobuyuki Sugii, and Toshiro Hiramoto, "Impact of Parameter Variations and Random Dopant Fluctuations on Short-Channel Fully-Depleted SOI MOSFETs with Extremely Thin BOX",IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI, USA, pp. 15 - 16, June, 2006.
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| [20] | K. Yokoyama, T. Nagumo, T. Ohtou, and T. Hiramoto, "Experimental Demonstration of Variable Body Factor FD SOI MOSFET with Thin Buried Oxide", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 78 - 79, June, 2005.
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| [19] | Kosuke Yanagidaira, Masumi Saitoh, and Toshiro Hiramoto, "FinFET-Type Silicon Nanocrystal Memories with Ultranarrow Channel", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 100 - 101, June, 2005.
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| [18] | Kousuke Miyaji, Masumi Saitoh, and Toshiro Hiramoto, "Analytical Model for Room-Temperature Operating Silicon Single-Electron Transistors with Discrete Quantum Energy Levels", Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, pp. 82 - 83, June, 2005.
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| [17] | Kosuke Yanagidaira, Masumi Saitoh, and Toshiro Hiramoto, "Performance Improvements in Silicon Nanocrystal Memories with Ultra-Thin-Body Double-Gate Structure", Hilton Hawaiian Village, Honolulu, HI, USA, pp. 141 - 142, June 2004.
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| [16] | Hidehiro Harata, Masumi Saitoh, and Toshiro Hiramoto, "Silicon Single-Hole Transistor with Large Coulomb Blockade Oscillations and High Voltage Gain at Room Temperature", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI, USA, pp. 81 - 82, June 2004.
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| [15] | Toshiharu Nagumo and Toshiro Hiramoto, "Reverse Short Channel Effect of Body Factor in Highly-Doped Low-Fin FETs by Corner Effect", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI, USA, pp.67 - 68, June 2004.
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| [14] | Gen Tsutsui, Masumi Saitoh, Toshiharu Nagumo, and Toshiro Hiramoto, "Impact of SOI Thickness Fluctuation on Threshold Voltage Variation in Ultra Thin Body SOI MOSFETs", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI, USA, pp. 25 - 26, June 2004.
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| [13] | Julien Brault, Masumi Saitoh, and Toshiro Hiramoto, "Channel Width and Length Dependence in Si Nano-Crystal Memories with Ultra Nano-Scale Channel", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI, USA, pp. 103 - 104, June 2004.
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| [12] | M. Saitoh, T. Murakami, and T. Hiramoto, "Large Coulomb Blockade Oscillations at Room Temperature in Ultra-Narrow Wire Channel MOSFETs Formed by Slight Oxidation Process", 2003 Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, Japan, pp. 76 - 77, June, 2003.
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| [11] | G. Tsutsui, T. Nagumo, and T. Hiramoto, "Enhancement of Adjustable Threshold Voltage Range by Substrate Bias Due to Quantum Confinement in Ultra Thin Body pMOSFETs", 2003 Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, Japan, pp. 6 - 7, June, 2003.
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| [10] | M. Saitoh, T. Murakami, and T. Hiramoto, "Effects of Oxidation Process on the Tunneling Barrier Height in Room-Temperature Operating Silicon Single-Electron Transistors", IEEE Silicon Nanoelectronics Workshop, Hilton Hawaiian Village, Honolulu, HI, USA, pp. 59 - 60, June, 2002.
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| [9] | M. Saitoh, T. Saito, T. Inukai, and T. Hiramoto, "Transport Spectroscopy of the Silicon Quantum Dot in a Single-Electron Transistor", 2001Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, pp. 36 - 37, June, 2001.
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| [8] | Toshiki Saito, Takuya Saraya, Takashi Inukai, Hideaki Majima, and Toshiro Hiramoto, "Suppression of Short Channel Effect in Triangular Parallel Wire Channel MOSFETs", 2001 Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, pp. 6 - 7, June, 2001.
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| [7] | Y. Yasuda, M. Takamiya, and T. Hiramoto, "Threshold Voltage Fluctuations Induced by Statistical "Position" and "Number" Impurity Fluctuations in Bulk MOSFETs", 2000 Silicon Nanoelectronics Workshop, Hawaii, USA, pp. 40 - 41, June, 2000.
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| [6] | Y. Yasuda, M. Takamiya, and T. Hiramoto, "Effects of Impurity Position Distribution on Threshold Voltage Fluctuations in Scaled MOSFETs", 1999 Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, Japan, pp. 86 - 87, June, 1999.
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| [5] | H. Majima, H. Ishikuro, and T. Hiramoto, "Threshold Voltage Shift in Ultra-Narrow MOSFETs by Quantum Mechanical Narrow Channel Effect", 1999 Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, Japan, pp. 76 - 77, June , June, 1999.
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| [4] | Y. Shi, H. M. Bu, X. L. Yuan, Y. D. Zheng, H. Ishikuro, H. Majima, and T. Hiramoto, "Random Telegraph Signals in Very Narrow Channel MOSFET", 1999 Silicon Nanoelectronics Workshop, Rihga Royal Hotel Kyoto, Kyoto, Japan, pp. 28 - 29, June, 1999.
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| [3] | K. Saito, Y. Shi, H. Ishikuro, and T. Hiramoto, "Narrow Channel MOS Memory Based on Silicon Nano-Crystals", 1998 IEEE Silicon Nanoelectronics Workshop, Hawaii, USA, pp. 17 - 18, June, 1998.
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| [2] | Hiroki Ishikuro and Toshiro Hiramoto, "Fabrication of Si Point Contact MOSFETs Acting as Single Electron Transistors at Room Temperature", Silicon Nanoelectronics Workshop 1997, Rihga Royal Hotel Kyoto, Kyoto, Japan, pp. 64 - 65, June, 1997.
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| [1] | T. Hiramoto, H. Ishikuro, T. Fujii, T. Saraya, G. Hashiguchi, and T. Ikoma, "Room Temperature Operation of Single Electron Transistors Fabricated by LSI-Compatible Anisotropic Etching Process on SOI Substrates", Silicon Nanoelectronics Workshop, Honolulu, Hawaii, USA, June, 1996.
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| [16] | Kyungmin Jang, Takuya Saraya, Masaharu Kobayashi, and Toshiro Hiramoto, “Ion/Ioff Ratio Enhancement of Gate-All-Around Nanowire Negative-Capacitance FET with Ferroelectric HfO2”, International Semiconductor Device Research Symposium (ISDRS), Hyatt Regency Bethesda, MD, USA, December 9, 2016.
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| [15] | Makoto Suzuki, Takuya Saraya, Ken Shimizu, Takayasu Sakurai, and Toshiro Hiramoto, "Improvement of Static Noise Margin in SRAM by Post-Fabrication Self-Convergence Technique", International Semiconductor Device Research Symposium (ISDRS), TP7-03, University of Maryland, Collage Park, MD, USA, December 10, 2009.
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| [14] | Ichiro Yamato, Tatsuya Mama, Takaaki Tsunomura, Akio Nishida, and Toshiro Hiramoto, "Anomalous Back-Bias Dependence of Threshold Voltage Variability in NMOSFETs Due to High Concentration Regions near Source and Drain", International Semiconductor Device Research Symposium (ISDRS), WP5-04, University of Maryland, Collage Park, MD, USA, December 9, 2009.
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| [13] | Jiezhi Chen, Takuya Saraya, Toshiro Hiramoto, "Experimental Study on Uniaxially Stressed Gate-All-Around Silicon Nanowires n-MOSFETs on (110) Silicon-On-Insulator", International Semiconductor Device Research Symposium (ISDRS), WP5-06, University of Maryland, Collage Park, MD, USA, December 9, 2009.
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| [12] | Toshiro Hiramoto, Gen Tsutsui, Ken Shimizu, and Masaharu Kobayashi (Invited), "Transport in Ultra-Thin-Body SOI and Silicon Nanowire MOSFETs", International Semiconductor Device Research Symposium (ISDRS), University of Maryland, College Park, MD, USA, TA6-02, December 13, 2007.
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| [11] | Keisuke Takahashi, Arifin Tamsir Putra, and Toshiro Hiramoto, "FinFETs with Both Large Body Factor and High Drive-Current", International Semiconductor Device Research Symposium (ISDRS), University of Maryland, College Park, MD, USA, WP9-01-11, December 12, 2007.
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| [10] | A.T. Putra, A. Nishida, S. Kamohara, T. Tsunomura, and T. Hiramoto, "Impact of Local Poly-Si Gate Depletion on Vth Variation in Nanoscale MOSFETs Investigated by 3D Device Simulation", International Semiconductor Device Research Symposium (ISDRS), University of Maryland, College Park, MD, USA, WP8-03, December 12, 2007.
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| [9] | Masaharu Kobayashi, Kousuke Miyaji, Masumi Saitoh, and Toshiro Hiramoto, "Large Temperature Dependence of Negative Differential Conductance in Room-Temperature Operating Silicon Single-Electron/Single-Hole Transistor", International Semiconductor Device Research Symposium, Bethesda, MD, USA, TP3-03, December, 2005.
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| [8] | Kousuke Miyaji, Masaharu Kobayashi, Tetsu Ohtou, and Toshiro Hiramoto, "On the Accuracy of Analytical Model for Room-Temperature Operating Silicon Single-Electron Transistors with Discrete Quantum Energy Levels", International Semiconductor Device Research Symposium, Bethesda, MD, USA, WP7-07-06, December, 2005.
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| [7] | A. Tamsir P., T. Ohtou, T. Nagumo and T. Hiramoto, "Critical Substrate Bias in Variable Threshold Voltage CMOS (VTCMOS) Scheme with Short Channel Devices", International Semiconductor Device Research Symposium, Bethesda, MD, USA, WP7-08-04, December, 2005.
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| [6] | Toshiharu Nagumo and Toshiro Hiramoto, "Design Guideline of Multi-Gate MOSFETs Considering Body Effect", International Semiconductor Device Research Symposium, Bethesda, MD, USA, TP6-04, December, 2005.
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| [5] | Anil Kumar, Toshiharu Nagumo, Gen Tsutsui, and T. Hiramoto, "Analytical Expression of Body Factor in Short Channel Bulk MOSFETs", 2003 International Semiconductor Device Research Symposium (ISDRS), Washington DC, USA, pp. 476 - 477, December, 2003.
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| [4] | G. Tsutsui, M. Saitoh, T. Nagumo, and T. Hiramoto, "Experimental Study on the Mobility Universality in Ultra Thin Body SOI pMOSFETs", 2003 International Semiconductor Device Research Symposium (ISDRS), Washington DC, USA, pp.361 - 362, December, 2003.
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| [3] | T. Hiramoto, T. Nagumo, and T. Ohtou(Invited), "Low-Power Device Design of Fully-Depleted SOI MOSFETs", 2003 International Semiconductor Device Research Symposium (ISDRS), Washington DC, USA, pp. 388 - 389, December, 2003.
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| [2] | Makoto Takamiya, Yuri Yasuda, and Toshiro Hiramoto, "Deep Sub-0.1µm Fully Depleted SOI MOSFET's with Ultra-Thin Silicon Film and Thick Buried Oxide for Low-Power Applications", Proceedings of 1997 International Semiconductor Device Research Symposium, Charlottesville, Virginia, USA, pp. 215 - 218, December, 1997.
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| [1] | T. Hiramoto (Invited), "Future Trend of Scaled LSI Devices and Single Electronics", 1995 International Semiconductor Device Research Symposium (ISDRS), pp. 801 - 802, Charlottesville, Virginia, USA, December, 1995.
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